**FIRST CALL FOR PAPERS**

The 2003 Spring Meeting of
THE TEXAS SOCIETY FOR MICROSCOPY
"Embracing All Forms of Microscopy"

April 3, 4, 5, 2003

Meeting will be held in Hubbard Hall on the campus of Texas
Woman's University, Denton, TX.

THURSDAY WORKSHOP
Microwave Techniques
Presented by Rick Giberson, Research and Development
Manager, Ted Pella, Inc.
Workshop sponsored by Ted Pella, Inc. and TSM

MSA LAS-SPONSORED SPEAKER
FRIDAY, APRIL 4, 2003
HUBBARD HALL
TWU - DENTON CAMPUS
Dr. Lucille A. Giannuzzi, Ph.D., Associate Professor,
Mechanical, Materials & Aerospace Engineering and Director,
UCF/Cirent Materials Characterization Facility, University
of Central Florida, Orlando, FL.
Topic: "Focused Ion Beam Specimen Preparation for
Everything". Focused ion beam techniques have been developed
to prepare site-specific specimens in a reproducible and
rapid manner for SEM and TEM analysis. The conventional and
the lift-out methods of specimen preparation will be
discussed and FIB applications on a wide range of materials
will be presented. The usefulness for using the FIB for
solving scientific research problems will be emphasized.

Registration forms, hotel information, and author's
instructions can be found on our website,
http://www.texasmicroscopy.org/ .  Questions about the
program can be directed to Jo Taylor, Program Chair, at
jtaylor@sfasu.edu.  Author's and abstract questions should
be directed to our Editor, Camelia Maier, at cmaier@twu.edu.

Pamela Neill
TSM President 2002-2003
www.texasmicroscopy.org
817-568-6497


PAM
Alcon Research
6201 South Freeway
Fort Worth, TX 76134-2099
817-551-4584